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Neues modulares Test Contactor-System

Author: Roland H. Neumeier, date: 27.07.10 05:19
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Photos:  Yamaichi Electronics

Tokyo / München: New Modular Test Contactor System

Rapid, Efficient and Durable are the key features of Yamaichi Electronics´ new semiconductor modular test contactor system Y-RED. With years of experience in designing customized test contactors, Y-RED combines state-of-the-art design and high-grade ease of use.

The Y-RED volume test socket is available for all established handler systems. The volume test socket and hinged type system for lab applications like burn-in / HAST, qualification, failure analysis and initial lab tests covers BGA, LGA and QFN packages with dimensions of up to 45 x 45 mm and pitches starting from 0.4 mm.

Highly standardized single parts allow a time-to-customer within 3-4 weeks between enquiry and product delivery. This gives our customers the assurance, that Yamaichi Electronics delivers the Y-RED Test Contactor in time.

Features like top side removable insert and tool-free cover mounting, minimise changeover times during testing semiconductors. This great advantage helps maximising efficiency and therefore minimising your cost per tested device.

Using high class materials combined with robust design and excellent electrical performance ensures that Y-RED matches perfectly our customers´ applications and requirements.

Y-RED is equipped with a new high performance spring probe with crown plunger tip for BGA and conical plunger tip for LGA and QFN packages. The two-piece pin combines extraordinary mechanical and electrical behaviour. The contact resistance is far below 50mΩ and shows an outstanding stability up to 500,000 mating cycles. The pin is available for the standard temperature range of -40°C up to +125°C and a high temperature range of -55°C up to +150°C.

As with all products from Yamaichi Electronics this too is RoHS compliant.

Links: www.yamaichi.eu, www.yamaichi.co.jp, www.y-red.com

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